Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits

Format Post in Electrical Engineering BY M. Bushnell, Vishwani Agrawal

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Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits M. Bushnell, Vishwani Agrawal is available to download Book Description Today’s electronic design and test engineers deal with several types of subsystems, namely, digital, memory, and mixed-signal, each requiring different test and design for testability This book provides a careful selection of essential topics on all three types of The outcome of testing is product quality, which means `meeting the user’s needs at a minimum The book includes test economics and techniques for determining the defect level of VLSI Besides being a textbook for a course on testing, it is a complete testability guide for an engineer working on any kind of electronic device or system or a book consists of: Part I: Introduction, Test Process and ATE, Test Economics and Product Quality, Fault Modeling; Part II: Logic and Fault Simulation, Testability Measures, Combinatorial ATPG, Sequential ATPG, Memory Test, DSP-Based Analog Test, Model-Based Analog Test, Delay Test, IDDQ Test; Part III: DFT and Scan Design, BIST, Boundary Scan, Analog Test Bus, System Test and Core-Based Design, Futur.This material is available do download at niSearch on M. Bushnell, Vishwani Agrawal's eBooks, .Essentials of Electronic Testing ... Textbook .

Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits

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